Interferometry based high-precision dilatometry for dimensional characterization of highly stable materials-Reference-Cited by-同舟云学术

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Interferometry based high-precision dilatometry for dimensional characterization of highly stable materials

Published:2009-07-03 Issue:9 Volume:20 Page:095301
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Cordero J,Heinrich T,Schuldt T,Gohlke M,Lucarelli S,Weise D,Johann U,Braxmaier C

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference15 articles.

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