Metrology in a scanning electron microscope: theoretical developments and experimental validation-Reference-Cited by-同舟云学术

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Metrology in a scanning electron microscope: theoretical developments and experimental validation

Published:2006-08-31 Issue:10 Volume:17 Page:2613-2622
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Sutton Michael A,Li Ning,Garcia Dorian,Cornille Nicolas,Orteu Jean Jose,McNeill Stephen R,Schreier Hubert W,Li Xiaodong

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference46 articles.

1. Applications of digital-image-correlation techniques to experimental mechanics

2. Application of an optimized digital correlation method to planar deformation analysis

3. Three-dimensional displacement measurements using digital image correlation and photogrammic analysis

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