A penetrating field electron-ion coincidence spectrometer for use in photoionization studies
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/3/i=3/a=011/pdf
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1. A new technique for threshold excitation spectroscopy
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3. Zero-kinetic-energy photoelectrom-photoion coincidence measurements of AR in the 2p and N2 in the 1s region
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