Measurement of the strain-induced coefficient of permittivity of sapphire using whispering gallery modes excited in a high-Qacoustic sapphire oscillator
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference16 articles.
1. Properties of a monolithic sapphire parametric transducer: prospects of measuring the standard quantum limit
2. CXII. The problem of the whispering gallery
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