Whole wafer magnetostriction metrology for magnetic films and multilayers
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/24/i=4/a=045601/pdf
Reference38 articles.
1. A soft magnetic CoNiFe film with high saturation magnetic flux density and low coercivity
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4. Magnetomechanical measurements of magnetically soft amorphous materials
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