Investigation of some critical aspects of on-line surface measurement by a wavelength-division-multiplexing technique
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference14 articles.
1. Recent advances in displacement measuring interferometry
2. Surface metrology
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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