Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres-Reference-Cited by-同舟云学术

Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres

Published:2003-08-11 Issue:10 Volume:14 Page:1753-1759
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Sadik A M,Ramadan W A,Litwin D

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference17 articles.

1. Ellipsometry of Anisotropic Films

2. Interferometer for measurement of absolute refractive index and thickness

3. Interferometric measurement of refractive indices

4. Whenever two beams interfere, one fringe equals one wave in the plane of interference, always

5. Optical interference method for the approximate determination of refractive index and thickness of a transparent layer

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