Nanomechanical mapping with resonance tracking scanned probe microscope
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference9 articles.
1. High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques
2. Atomic force acoustic microscopy methods to determine thin-film elastic properties
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5. Resonance tracking ultrasonic atomic force microscopy
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