Towards in-process x-ray CT for dimensional metrology-Reference-Cited by-同舟云学术

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Towards in-process x-ray CT for dimensional metrology

Published:2016-01-19 Issue:3 Volume:27 Page:035401
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Warnett Jason M,Titarenko Valeriy,Kiraci Ercihan,Attridge Alex,Lionheart William R B,Withers Philip J,Williams Mark A

Funder

Engineering and Physical Sciences Research Council

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/27/i=3/a=035401/pdf

Reference49 articles.

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