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A universal ion-beam-sputtering device for diffusion studies

Published:1996-04-01 Issue:4 Volume:7 Page:632-640
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Wenwer Friedrich,Gude Anja,Rummel Gerhard,Eggersmann Martin,Zumkley Thomas,Stolwijk Nicolaas A,Mehrer Helmut

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/7/i=4/a=021/pdf

Reference23 articles.

1. A UNIVERSAL MICROSECTIONING TECHNIQUE FOR DIFFUSION

2. The evaluation of radio-frequency sputtering as a microsectioning technique for the tracer diffusion studies in oxides

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