Fringe effect of electrical capacitance and resistance tomography sensors
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/24/i=7/a=074002/pdf
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1. Electrical resistance tomography for process applications
2. Simulation study of the electrode array used in an ERT system
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4. Studies on the effect of the third dimension on a two-dimensional electrical impedance tomography system
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