Nanoparticle metrology standards based on the time-resolved fluorescence anisotropy of silica colloids
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference41 articles.
1. Particle size distribution and determination of characteristic properties of colloidal bismuth—silica compounds by small-angle X-ray scattering and inelastic light scattering
2. Study of a Commercial SiO2 Sol and Gel by Small Angle X-ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme
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