Emissivity compensated spectral pyrometry—algorithm and sensitivity analysis
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/25/i=2/a=025011/pdf
Reference23 articles.
1. Fundamentals of Semiconductor Processing Technology
2. Fabrication and Welding Engineering
3. Comparison between multiwavelength infrared and visible pyrometry: Application to metals
4. Multiwavelength infrared pyrometry: optimization and computer simulations
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