Single-cantilever dual-frequency-modulation atomic force microscopy
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference39 articles.
1. Determination of pull-off forces of textured silicon surfaces by AFM force curve analysis
2. Nanomechanical analysis of cells from cancer patients
3. An atomic force microscope head designed for nanometrology
4. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope
5. A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy
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