High angular resolution slope measuring deflectometry for the characterization of ultra-precise reflective x-ray optics-Reference-Cited by-同舟云学术

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High angular resolution slope measuring deflectometry for the characterization of ultra-precise reflective x-ray optics

Published:2012-06-11 Issue:7 Volume:23 Page:074015
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Siewert F,Buchheim J,Höft T,Fiedler S,Bourenkov G,Cianci M,Signorato R

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/23/i=7/a=074015/pdf

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-pressure single-crystal diffraction at the Australian Synchrotron;Journal of Synchrotron Radiation;2023-06-15

2. Interferometrical profilometer for high precision 3D measurements of free-form optics topography with large local slopes;Eighth European Seminar on Precision Optics Manufacturing;2021-06-07

3. P13, the EMBL macromolecular crystallography beamline at the low-emittance PETRA III ring for high- and low-energy phasing with variable beam focusing;Journal of Synchrotron Radiation;2017-01-01

4. Characterization of a piezo bendable X-ray mirror;Journal of Synchrotron Radiation;2016-01-01

5. Present research status of piezoelectric bimorph mirrors in synchrotron radiation sources;Acta Physica Sinica;2016

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