A new method for the distance control of a scanning Kelvin microscope
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/3/i=2/a=017/pdf
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1. Micro Kelvin probe for local work‐function measurements
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4. Design and performance of a Kelvin probe for the study of topographic work functions
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