A new accurate technique for determination of crystallographic orientation of surfaces of single crystal wafers-Reference-Cited by-同舟云学术

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A new accurate technique for determination of crystallographic orientation of surfaces of single crystal wafers

Published:1990-08-01 Issue:8 Volume:1 Page:793-800
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Lal K,Bhagavannarayana G,Kumar V,Halder S K

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference18 articles.

1. Device for preparing accurately X-ray oriented crystals

2. TAILLESS X‐RAY SINGLE‐CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Accurate determination of surface orientation of single-crystal wafers using high-resolution X-ray rocking curve measurements;Journal of Applied Crystallography;2013-09-11

2. Growth of Benzimidazole Single Crystal by Sankaranarayanan−Ramasamy Method and Its Characterization by High-Resolution X-ray Diffraction, Thermogravimetric/Differential Thermal Analysis, and Birefringence Studies;Crystal Growth & Design;2007-01-10

3. Study of point defects in as-grown and annealed bismuth germanate single crystals;Journal of Applied Crystallography;2005-05-13

4. Interpreting oscillatory Bragg peak positions;Journal of Applied Crystallography;1996-08-01

5. Combined Asymmetric Reflection and Transmission Method for High Accuracy X-ray Crystallographic Measurements;Advances in X-Ray Analysis;1994

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