A novel technique combining high-resolution synchrotron x-ray microtomography and x-ray diffraction for characterization of micro particulates-Reference-Cited by-同舟云学术

A novel technique combining high-resolution synchrotron x-ray microtomography and x-ray diffraction for characterization of micro particulates

Published:2011-09-19 Issue:11 Volume:22 Page:115703
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Merrifield David R,Ramachandran Vasuki,Roberts Kevin J,Armour Wesley,Axford Danny,Basham Mark,Connolley Thomas,Evans Gwyndaf,McAuley Katherine E,Owen Robin L,Sandy James

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference27 articles.

1. Solid-state properties of powders in the formulation and processing of solid dosage forms

2. Face specific surface properties of pharmaceutical crystals

3. Molecular Modeling of Crystal−Crystal Interactions between the α- and β-Polymorphic Forms of l-Glutamic Acid Using Grid-Based Methods

4. X-ray micro-tomography an attractive characterisation technique in materials science

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