Characterization method of dielectric properties of free falling drops in a microwave processing cavity and its application in microwave internal gelation-Reference-Cited by-同舟云学术

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Characterization method of dielectric properties of free falling drops in a microwave processing cavity and its application in microwave internal gelation

Published:2013-08-06 Issue:9 Volume:24 Page:095009
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Cabanes-Sempere M,Catalá-Civera J M,Peñaranda-Foix F L,Cozzo C,Vaucher S,Pouchon M A

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/24/i=9/a=095009/pdf

Reference25 articles.

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2. Mechanical Packing of Spherical Particles

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1. In-situ monitoring for liquid metal jetting using a millimeter-wave impedance diagnostic;Scientific Reports;2020-12

2. An in-situ millimeter-wave diagnostic for droplet characterization during jetting-based additive manufacturing processes;Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation IX;2020-04-22

3. Sphere-Pac and Vipac Fuel;Comprehensive Nuclear Materials;2020

4. Movable short-circuit technique to extract the relative permittivity of materials from a coaxial cell;Journal of Measurements in Engineering;2019-12-31

5. Single-mode microwave cavities for material processing and sensing;Microwave/RF Applicators and Probes;2015

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