Second-order space focusing in two-field time-of-flight mass spectrometers
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/4/i=12/a=035/pdf
Reference4 articles.
1. Time‐of‐Flight Mass Spectrometer with Improved Resolution
2. The renaissance of time-of-flight mass spectrometry
3. A photoelectron-ion-ion triple coincidence technique for the study of double photoionization and its consequences
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