Multilayered Cu/Cr films as strain gauges
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference10 articles.
1. Electrical conduction in Cu/Mn multilayer films
2. Comment on the paper: On the theory of the Bragg reflection in the case of multiple X-ray diffraction
3. On the suitability of Cu/Mn multilayered films as strain gauges
4. The electromechanical properties of thin manganese films
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2. An Easy Way to Quantify the Adhesion Energy of Nanostructured Cu/X (X = Cr, Ta, Mo, Nb, Zr) Multilayer Films Adherent to Polyimide Substrates;Acta Metallurgica Sinica (English Letters);2016-02
3. Development of the invar36 thin film strain gauge sensor for strain measurement;Measurement Science and Technology;2014-04-16
4. Cracked titanium film on an elastomeric substrate for highly flexible, transparent, and low-power strain sensors;Nanoscale Research Letters;2013-10-24
5. Stability of interfaces in Mo/Cu multilayered metallization;Thin Solid Films;1996-05
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