Open questions in surface topography measurement: a roadmap-Reference-Cited by-同舟云学术

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Open questions in surface topography measurement: a roadmap

Published:2015-01-22 Issue:1 Volume:3 Page:013001
ISSN:2051-672X
Container-title:Surface Topography: Metrology and Properties
language:
Short-container-title:Surf. Topogr.: Metrol. Prop.

Author:

Leach Richard,Evans Christopher,He Liangyu,Davies Angela,Duparré Angela,Henning Andrew,Jones Christopher W,O’Connor Daniel

Publisher

IOP Publishing

Subject

Materials Chemistry,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation

Link

http://stacks.iop.org/2051-672X/3/i=1/a=013001/pdf

Reference40 articles.

1. Use of power spectral density (PSD) functions in specifying optics for the National Ignition Facility

2. Scattering effects from residual optical fabrication errors

3. Mid-spatial Frequency Specification and Characterization for Freeform Surfaces

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