Lateral scanning white-light interferometry on rotating objects
Author:
Funder
Bundesministerium für Bildung und Forschung
Publisher
IOP Publishing
Subject
Materials Chemistry,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation
Link
https://iopscience.iop.org/article/10.1088/2051-672X/aba484/pdf
Reference20 articles.
1. Laser light source limited uncertainty of speckle-based roughness measurements
2. In-process roughness quality inspection for metal sheet rolling
3. DIN 4760:1982-06, Gestaltabweichungen; Begriffe, Ordnungssystem
4. DIN EN ISO 25178-604:2013-12, Geometrische Produktspezifikation (GPS)_- Oberflächenbeschaffenheit: Flächenhaft_- Teil_604: Merkmale von berührungslos messenden Geräten (Weißlicht-Interferometrie) (ISO_25178-604:2013); Deutsche Fassung EN_ISO_25178-604:2013
5. White-Light Interferometric Thickness Gauge
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4. A lateral-scanning white-light interferometer for topography measurements on rotating objects in process environments;CIRP Annals;2022
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