The relation between fractal signature and topography parameters: a numerical and experimental study
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation
Link
http://iopscience.iop.org/article/10.1088/2051-672X/aaed86/pdf
Reference30 articles.
1. Quantitative characterization of surface topography using spectral analysis
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3. Statistical models of nearly complete elastic rough surface contact-comparison with numerical solutions
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