Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1674-1056/26/5/058502/pdf
Reference29 articles.
1. Susceptibility of Electronic Systems to High-Power Microwaves: Summary of Test Experience
2. High Power Laser and Particle Beams
3. Damage effects on low noise amplifiers with microwave pulses
4. High power microwave damage mechanism on high electron mobility transistor
5. High Power Laser and Particle Beams
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