Stacking-dependent exchange bias in two-dimensional ferromagnetic/antiferromagnetic bilayers

Author:

Li 李 Huiping 慧平,Pan 潘 Shuaiwei 帅唯,Wang 王 Zhe 喆,Xiang 向 Bin 斌,Zhu 朱 Wenguang 文光

Abstract

A clear microscopic understanding of exchange bias is crucial for its application in magnetic recording, and further progress in this area is desired. Based on the results of our first-principles calculations and Monte Carlo simulations, we present a theoretical proposal for a stacking-dependent exchange bias in two-dimensional compensated van der Waals ferromagnetic/antiferromagnetic bilayer heterostructures. The exchange bias effect emerges in stacking registries that accommodate inhomogeneous interlayer magnetic interactions between the ferromagnetic layer and different spin sublattices of the antiferromagnetic layer. Moreover, the on/off switching and polarity reversal of the exchange bias can be achieved by interlayer sliding, and the strength can be modulated using an external electric field. Our findings push the limits of exchange bias systems to extreme bilayer thickness in two-dimensional van der Waals heterostructures, potentially stimulating new experimental investigations and applications.

Publisher

IOP Publishing

Subject

General Physics and Astronomy

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