Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1674-1056/22/11/116105/pdf
Reference22 articles.
1. A nuclear-track-recording polymer of unique sensitivity and resolution
2. Formation and growth of tracks in nuclear track materials
3. Ultra-high resolution radiography using CR-39 solid state track detectors and atomic force microscopy
4. 3-D Track Analysis Using a Confocal Laser Scanning Microscope
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