Neutron powder diffraction and high-pressure synchrotron x-ray diffraction study of tantalum nitrides-Reference-Cited by-同舟云学术

Neutron powder diffraction and high-pressure synchrotron x-ray diffraction study of tantalum nitrides

Published:2018-02 Issue:2 Volume:27 Page:026201
ISSN:1674-1056
Container-title:Chinese Physics B
language:
Short-container-title:Chinese Phys. B

Author:

Feng Lei-hao,Hu Qi-wei,Lei Li,Fang Lei-ming,Qi Lei,Zhang Lei-lei,Pu Mei-fang,Kou Zi-li,Peng Fang,Chen Xi-ping,Xia Yuan-hua,Kojima Yohei,Ohfuji Hiroaki,He Duan-wei,Chen Bo,Irifune Tetsuo

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1088/1674-1056/27/2/026201/pdf

Reference27 articles.

1. The Chemistry of Transition Metal Carbides and Nitrides

2. Properties of thin Ta–N films reactively sputtered on Cu/SiO2/Si substrates

3. Synthesis and characterization of nanocrystalline TaN

4. Miniature hybrid microwave ICs using a novel thin-film technology

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