Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant
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Published:2017-08-04
Issue:5
Volume:54
Page:653-662
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ISSN:0026-1394
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Container-title:Metrologia
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language:
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Short-container-title:Metrologia
Author:
Müller Matthias,
Beckhoff Burkhard,
Beyer Edyta,
Darlatt Erik,
Fliegauf Rolf,
Ulm Gerhard,
Kolbe MichaelORCID
Subject
General Engineering
Cited by
10 articles.
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