Top electrode size effects in the piezoresponse force microscopy of piezoelectric thin films attached to a rigid substrate-Reference-Cited by-同舟云学术

Top electrode size effects in the piezoresponse force microscopy of piezoelectric thin films attached to a rigid substrate

Published:2017-09-20 Issue:10 Volume:26 Page:105045
ISSN:0964-1726
Container-title:Smart Materials and Structures
language:
Short-container-title:Smart Mater. Struct.

Author:

Wang J H

Funder

Natural Science Basic Research Plan in Shaanxi Province of China

National Natural Science Foundation of China

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics,Civil and Structural Engineering,Signal Processing

Link

http://iopscience.iop.org/article/10.1088/1361-665X/aa89ad/pdf

Reference36 articles.

1. Nanoscale piezoelectric coefficient measurements in ionic conducting ferroelectrics

2. Ferroelectric thin films for micro-sensors and actuators: a review

3. Nanoscale Characterisation of Ferroelectric Materials

4. Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

5. Modeling and measurement of surface displacements in BaTiO3 bulk material in piezoresponse force microscopy

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