An investigation of thin silver films on cleaved silicon surfaces
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/12/i=12/a=030/pdf
Reference43 articles.
1. Electronic Structure of an Ordered Monolayer of Cu on Zn(0001)
2. Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon
3. Chemical Bonding and Structure of Metal-Semiconductor Interfaces
4. Surface States and Surface Bonds of Si(111)
5. Surface States and Rectification at a Metal Semi-Conductor Contact
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