Extended X-ray absorption fine structure (EXAFS) at the K edge of cadmium (26.7 keV) with synchrotron radiation
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/16/i=5/a=007/pdf
Reference13 articles.
1. The Adone Wiggler facility
2. Multiple Bragg reflection monochromators for synchrotron x radiation
3. New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystals
4. Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected results
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reductive Adsorption of Cd2+ on a Nickel Surface in Aqueous Solution: Characterization of Surface Adatoms by in Situ EXAFS;The Journal of Physical Chemistry C;2008-07-26
2. Measurements of the extended X-ray absorption fine structure (EXAFS) spectra at the K edges of cerium, praseodymium and samarium compounds with synchrotron radiation;Journal of Physics C: Solid State Physics;1987-11-10
3. Orientation and temperature dependence of the Cd K-shell EXAFS of polycrystalline and single-crystal Cd metal;Journal of Physics C: Solid State Physics;1987-03-10
4. EXAFS spectroscopy: a new method for structural investigation;Uspekhi Fizicheskih Nauk;1986
5. EXAFS evidence for local order in aqueous solutions of CdBr2;Journal of Physics C: Solid State Physics;1985-01-10
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