The nature of dangling bonds at line defects in covalent semiconductors
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/14/i=15/a=008/pdf
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Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Self-consistent electronic structure of vacancies in semiconductors;Journal of Crystal Growth;1985-07
2. The electronic structure and stability of localised defects in semiconductors. II. Vacancies in silicon, gallium phosphide and zinc selenide;Journal of Physics C: Solid State Physics;1984-05-20
3. Electronic structure calculation of V2+O2 complexes in silicon;Solid State Communications;1984-02
4. Electronic structure of line defects by means of the scattering theoretical method. Application to lines of vacancies in the simple cubic lattice;Physical Review B;1983-10-15
5. DEEP ELECTRON LEVELS AND FURTHER EFFECTS OF TOPOLOGICAL DISORDER BY DISLOCATIONS;Le Journal de Physique Colloques;1983-09
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