EXAFS of ultra thin layers of Cu
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/11/i=20/a=003/pdf
Reference6 articles.
1. Adsorbate and Substrate Characterization Using Extended X-Ray Absorption Fine Structure
2. EXAFS of Cu obtained with a conventional X-ray source
3. Synchrotron-like intensities with a rotating anode and a focusing dispersing crystal
4. Synchrotron Radiation Studies of theK-Edge Photoabsorption Spectra of Kr,Br2, and GeCl4: A Comparison of Theory and Experiment
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Development of a chamber for in situ polarized total‐reflection fluorescence x‐ray absorption fine structure spectroscopy;Review of Scientific Instruments;1995-12
2. Laboratory EXAFS by Fluorescence Detection;Japanese Journal of Applied Physics;1990-10-20
3. Surface-extended x-ray-absorption fine-structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity;Physical Review B;1989-05-15
4. An investigation of chromate inhibitors on aluminium using fluorescence detection of X-ray absorption;Corrosion Science;1987-01
5. The Exafs Spectroscopy Applied to the Ionic Aggregates of Halato-Telechelic Polymers;Structure and Properties of Ionomers;1987
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