Direct measurement for the decay probabilities of 4djhole states in xenon by means of photoelectron-ion coincidences
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/0953-4075/25/i=17/a=014/pdf
Reference21 articles.
1. Double Auger decay in atoms: Probability and angular distribution
2. Subshell photoionization of Xe between 40 and 1000 eV
3. Multiple Photo-Ionization of Xenon
4. Experimental Evidence for Double Electron Emission in an Auger Process
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