Soft x-ray irradiation induced metallization of layered TiNCl

Author:

Kataoka NoriyukiORCID,Tanaka MasashiORCID,Hosoda Wataru,Taniguchi Takumi,Fujimori Shin-ichi,Wakita Takanori,Muraoka Yuji,Yokoya TakayoshiORCID

Abstract

Abstract We have performed soft x-ray spectroscopy in order to study the photoirradiation time dependence of the valence band structure and chemical states of layered transition metal nitride chloride TiNCl. Under the soft x-ray irradiation, the intensities of the states near the Fermi level (E F) and the Ti3+ component increased, while the Cl 2p intensity decreased. Ti 2p–3d resonance photoemission spectroscopy confirmed a distinctive Fermi edge with Ti 3d character. These results indicate the photo-induced metallization originates from deintercalation due to Cl desorption, and thus provide a new carrier doping method that controls the conducting properties of TiNCl.

Funder

Ministry of Education, Culture, Sports, Science and Technology

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

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