Quantitative atomic force microscopy
Author:
Funder
Deutsche Forschungsgemeinschaft
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/29/i=27/a=274001/pdf
Reference39 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy
4. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
5. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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