Simulation study of near-field enhancement on a laser-irradiated AFM metal probe
Author:
Publisher
IOP Publishing
Subject
Industrial and Manufacturing Engineering,Condensed Matter Physics,Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/1555-6611/23/i=7/a=076003/pdf
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1. Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution
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3. Diode-pumped high efficient Tm:YLF laser output at 1908 nm with near-diffraction limited beam quality
4. Efficient near diffraction limited blue light source by sum-frequency mixing of a BAL and a solid-state laser
5. Decay Length of Surface Plasmons Determined with a Tunnelling Microscope
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