The Response of Advanced Generation Wheat Lines Derived from Convergent Breeding to Biotic Stress in High Altitude Area

Abstract

Abstract Wheat development in tropical regions faces various obstacles, one of which is biotic stress from pests and diseases. This research aims to determine how these limiting factors inhibit production improvement. The study was conducted in high altitude areas characterized by high rainfall and various organisms that symbiotically adapt to wheat plants. An analysis was performed to assess the impact of biotic stress on the observed response variables. The research arranged in randomized complete block design (RCBD) with 3 replications, using 26 advanced-generation wheat lines derived from convergent breeding and four check national varieties. Results showed that some organisms impacted lodged plants, empty spikelets, and yellow spots on flag leaves. The percentage of empty florets was the most significant factor affecting seed yield. The resistance level to the yellow leaf spot of all wheat lines and varieties was thought to be good because the inoculum of the yellow leaf spot pathogen was still limited. Yield character performance of almost all wheat lines were better compare to the national varieties which were used as control. Lodging frequency and empty florets correlated negatively to seed weight. Empty florets had the strongest direct negative effect on yield compared to other characters.