Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters
Author:
Publisher
IOP Publishing
Subject
Radiology, Nuclear Medicine and imaging,Radiological and Ultrasound Technology
Reference25 articles.
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1. Characterization of Commercial P-MOSFETs for Using as a Gamma-Rays Dosimeter;Silicon;2021-02-06
2. Semiconductor dosimetry in modern external-beam radiation therapy;Physics in Medicine & Biology;2020-08-31
3. Response to ionizing radiation of different biased and stacked pMOS structures;Sensors and Actuators A: Physical;2016-12
4. Comparative study of MOSFET response to photon and electron beams in reference conditions;Sensors and Actuators A: Physical;2015-04
5. Accuracy Improvement of MOSFET Dosimeters in Case of Variation in Thermal Parameters;IEEE Transactions on Nuclear Science;2015-04
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