Absolute keV x-ray yield and conversion efficiency in over dense Si sub-petawatt laser plasma

Abstract

Abstract Laser-produced plasmas are bright, short sources of x-rays commonly used for time-resolved imaging and spectroscopy. Their usage implies accurate knowledge of laser-to-x-ray conversion efficiency (CE), spectrum, photon yield and angular distribution. Here, we report on soft x-ray emission in the direction close to the target normal from a thin Si foil irradiated by a sub-PW picosecond laser pulse. These absolute measurements cover a continuous and broad spectral range that extends from 4.75 to 7.3 Å (1.7–2.6 keV). The x-ray spectrum consists of spectral line transitions from highly charged ions and broadband emission with contributions from recombination and free-free processes that occur when electrons decelerate in plasma electromagnetic fields. Angular distribution of the emission was investigated via particle-in-cell simulations, which allowed to estimate the yield into the full solid angle. We find that experimental and simulation estimations of laser to free-free emission CE are in good agreement.