Optimal gate selection method for simultaneous lifetime-based measurement of PSP and TSP

Author:

Kasai MikuORCID,Nagata TakayukiORCID,Nonomura TakuORCID,Saito YujiORCID,Asai KeisukeORCID

Abstract

Abstract In this study, a new method that optimizes a measurement condition in a lifetime-based simultaneous measurement of a pressure-sensitive paint (PSP) and a temperature-sensitive paint (TSP) is proposed for the improvement of the accuracy of the pressure measurement. An optimal gate is selected based on a pressure measurement error when calculating the pressure and the temperature simultaneously from measurement values of a PSP and a TSP. A shot noise of a PSP, a temperature error, and a fluctuation in an emission intensity ratio due to blurring were considered error factors of the PSP measurement. The pressure measurement error propagated from each error source was considered as an evaluation index in an optimization of a measurement condition. We evaluated 17 types of TSP characteristics and selected an optimal TSP and a measurement condition for the PSP measurement. Further, the optimized measurement condition was evaluated in a PSP/TSP simultaneous measurement using a coupon-based test. The optimal measurement condition obtained based on the proposed method and an empirical selection method were compared by a PSP/TSP simultaneous measurement using a coupon-based test. A small-pressure measurement error, i.e. high pressure-measurement accuracy, was realized by the proposed method in the simultaneous lifetime-based method of a PSP and a TSP. In addition to the analyses above, the blurring effects were found to be minor and briefly summarized in appendices.

Funder

Core Research for Evolutional Science and Technology

Japan Society for the Promotion of Science

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

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