Adjustment for profile deviations of gear involute artefacts

Author:

Ling MingORCID,Ling Siying,Yu Dianqing,Wang FengtaoORCID,Shi Zhaoyao,Wang Liding

Abstract

Abstract Gear involute artefact (GIA) is a kind of measurement standard for calibrating the gear involute measuring instrument. To reduce the profile form deviations and the difference of the profile slope deviations between the opposite flanks (left and right flank) of GIA, the effect of installation eccentricity on the profile deviations is analysed, and an adjustment method for profile deviations of GIA by the eccentric installation is proposed. The difference of profile slope deviations between the opposite flanks of GIA with designed base circle radius r b = 100 mm changes from 0.31 μm to 0.1 μm after the adjustment through the eccentricity of the mandrel. The difference of profile slope deviations between the opposite flanks of GIA with designed base circle radius r b = 60cos20° mm changes from 0.77 μm to 0.12 μm after the adjustment through a kind of rotary stroke bearing with eccentricity, meanwhile, the profile form deviations are reduced from 0.53 μm to 0.34 μm (right flank) and 0.89 μm to 0.46 μm (left flank). This adjustment method could improve the used accuracy of GIA without improving the machining accuracy of the involute and changing the measurement process of the measurement standard of GIA.

Funder

National Natural Science Foundation of the People’s Republic of China

Research and Development Program of the People’s Republic of China

Guangdong Provincial University Innovation Team Project

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference14 articles.

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Wire electrochemical contour evolution machining of gear involute artifact with horizontal electrode;The International Journal of Advanced Manufacturing Technology;2023-11-01

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