Analysis for system errors in measuring the sidewall angle of a silica waveguide with confocal laser scanning microscope (CLSM)
Author:
Funder
Nature Science Fund of Jilin Province, China
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/30/i=2/a=025004/pdf
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1. Planar Lightwave Circuits (PLCs)
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