Vacuum spectrophotometer for specular reflectance measurements at high temperature. Application to monocrystalline silicon
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IOP Publishing
Reference3 articles.
1. Measurement of absolute reflectance at nearly normal incidence
2. Optical Constants of Silicon in the Region 1 to 10 ev
3. Optical constants for silicon at 300 and 10 K determined from 1.64 to 4.73 eV by ellipsometry
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