Mechanism of Secondary Ionization in Low-Pressure Breakdown in Hydrogen
Author:
Publisher
IOP Publishing
Subject
Industrial and Manufacturing Engineering,Metals and Alloys,Strategy and Management,Mechanical Engineering
Link
http://stacks.iop.org/0370-1301/64/i=6/a=308/pdf
Reference12 articles.
1. Secondary electron emission Part VI. The influence of externally adsorbedions and atoms on the secondary electron emission of metals
2. Kathodenzerst�ubung
3. Kathodenzerst�ubung
4. The Townsend Coefficients for Ionization by Collision in Pure and Contaminated Hydrogen as a Function of the Cathode Material
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1. Low-pressure long-gap discharge in hydrogen;Electrical Engineering in Japan;1986
2. Self-Sustaining Partial Discharges in Argon at the Dielectric Surface;IEEE Transactions on Electrical Insulation;1983-08
3. Field-dependent electron emission from heat-treated electrodes in nitrogen;Proceedings of the Physical Society;1966-03
4. Primary Ionization Coefficient of Helium;Proceedings of the Physical Society;1962-10
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