Multiple-Beam Interferometry: Intensity Distribution in the Reflected System
Author:
Publisher
IOP Publishing
Subject
Industrial and Manufacturing Engineering,Metals and Alloys,Strategy and Management,Mechanical Engineering
Link
http://stacks.iop.org/0370-1301/62/i=7/a=301/pdf
Reference6 articles.
1. Multiple-beam localized fringes: part I. - Intensity distribution and localization
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3. The topography of crystal faces - II. The topography of cleavage faces of mica and selenite
4. Low-order multiple-beam interferometry
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