Abstract
Abstract
Raman spectroscopy is a powerful method that gives insight into the atomic structure and composition of nanomaterials, but also allows to draw conclusions about their electronic properties. It is based on the inelastic scattering of light, which is able to excite phonons in the material. In the field of semiconductor nanocrystals, Raman spectroscopy has been employed to make significant contributions to the analysis of lattice distortion, interfaces, phase mixing, and defect formation. Yet, there is no clear consensus on how the electronic and crystal structure of the material interacts with the incident light to yield the observed spectra. This review gives a brief overview over the method. It then reviews the most important findings, current developments, and discusses the efforts to formulate a consistent model that allows to establish the method as a tool for structural analysis.
Subject
Electrical and Electronic Engineering,General Materials Science,Biomedical Engineering,Atomic and Molecular Physics, and Optics,General Chemistry,Bioengineering
Cited by
7 articles.
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