The single-event effect evaluation technology for nano integrated circuits-Reference-Cited by-同舟云学术

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The single-event effect evaluation technology for nano integrated circuits

Published:2015-11 Issue:11 Volume:36 Page:115002
ISSN:1674-4926
Container-title:Journal of Semiconductors
language:
Short-container-title:J. Semicond.

Author:

Zheng Hongchao,Zhao Yuanfu,Yue Suge,Fan Long,Du Shougang,Chen Maoxin,Yu Chunqing

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/1674-4926/36/i=11/a=115002/pdf

Reference22 articles.

1. Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. System-on-chip single event effect hardening design and validation using proton irradiation;Nuclear Engineering and Technology;2023-03

2. Dielectric, Hydrophobic Investigation of ABS/NiFe2O4 Nanocomposites Fabricated by Atomized Spray Assisted and Solution Casted Techniques for Miniaturized Electronic Applications;Journal of Electronic Materials;2018-06-29

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