The expression correction of transistor current gain and its application in reliability assessment
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Published:2014-09
Issue:9
Volume:35
Page:094008
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ISSN:1674-4926
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Container-title:Journal of Semiconductors
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language:
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Short-container-title:J. Semicond.
Author:
Qi Haochun,Zhang Xiaoling,Xie Xuesong,Zhao Li,Chen Chengju,Lü Changzhi
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials